Comparisons of model size and complexity. FLOPs: the number of

Interface trap density of Si/BOX of the control and hardened SOI wafers.

Illustration of our approach for dense captioning. (a) For a region

Band diagram of Si/BOX interface showing charged acceptor traps.

Comparisons of model size and complexity. FLOPs: the number of

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论文阅读笔记（七十一）【CVPR2018】：Harmonious Attention Network for Person Re-Identification - 橙同学的学习笔记- 博客园

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